Spectroscopic reflectometer Ocean Optics NanoCalc 2000 (NANOCALC)
Guarantor:
Vojtěch Švarc, Ph.D.
Instrument status:
Operational, 17.3.2023 11:56
Equipment placement:
CEITEC Nano - C1.30
Multilayers characterization of transparent materials, such as lithography resists, oxides or thin metals in reflection mode. The interval of measured film thickness is from 10 nm up to 100 um.
Publications:
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Horký, M., 2025: . PH.D. THESIS , p. 1 - 181; FULL TEXT
(RAITH, MIRA-EBL, LYRA, TEGRAMIN, SUSS-MA8, DEKTAK, NANOCALC, MAGNETRON, EVAPORATOR, RIE-FLUORINE, WIRE-BONDER, MPS150, CRYOGENIC, LAKESHORE, VERSALAB, ICON-SPM, UHV-PREPARATION, TITAN, HELIOS, VERIOS, RIGAKU3, RIGAKU9) -
Děcký, M., 2025: . MASTER'S THESIS , p. 1 - 63; FULL TEXT
(MIRA-EBL, SUSS-MA8, DEKTAK, NANOCALC, MAGNETRON, RIE-FLUORINE, EVAPORATOR, WIRE-BONDER, MPS150, LYRA, LASER-DICER) -
Koňařík, L., 2024: . BACHELOR'S THESIS , p. 1 - 46; FULL TEXT
(LASER-DICER, DWL, EVAPORATOR, RIE-FLUORINE, DRIE, NANOCALC, DEKTAK, WIRE-BONDER, LYRA) -
GALLINA, P.; KVAPIL, M.; LIŠKA, J.; KONEČNÁ, A.; KŘÁPEK, V.; KALOUSEK, R.; ZLÁMAL, J.; ŠIKOLA, T., 2023: . PHYSICAL REVIEW B 107(12), p. 125144 - 6, doi: 10.1103/PhysRevB.107.125144; FULL TEXT
(ALD-FIJI, EVAPORATOR, MIRA-EBL, FTIR, NANOCALC, DEKTAK, WOOLLAM-MIR, ICON-SPM) -
Idesová, B., 2023: . MASTER'S THESIS , p. 1 - 71; FULL TEXT
(EVAPORATOR, ALD-FIJI, RAITH, NANOCALC, SCIA)
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Jarušek, J., 2022: . BACHELOR'S THESIS , p. 1 - 75; FULL TEXT
(DEKTAK, KAUFMAN, RIE-CHLORINE, NANOCALC, RIGAKU9, KEITHLEY-4200) -
Chmela, O., 2020: . PH.D THESIS , p. 1 - 199
(ALD-FIJI, DWL, KAUFMAN, DIENER, SUSS-MA8, SUSS-RCD8, RAITH, MAGNETRON, EVAPORATOR, RIE-FLUORINE, SCIA, DEKTAK, NANOCALC, MPS150, WIRE-BONDER, ICON-SPM) -
Fabianová, K., 2016: . BACHELOR’S THESIS , p. 1 - 54
(PECVD, MIRA-EBL, RIE-FLUORINE, NANOCALC, MAGNETRON, EVAPORATOR, LYRA) -
Kvapil, M., 2015: . PH.D. THESIS , p. 1 - 104
(FTIR, NANOCALC, DIENER, LYRA) -
Lišková, Z., 2015: . PH.D. THESIS , p. 1 - 106
(MIRA-EBL, DIENER, NANOCALC, DWL, EVAPORATOR, WIRE-BONDER, ALD-FIJI, LYRA)
Photogallery
Specification
| Spectral Range | 250 – 1100 nm |
|---|---|
| Total thickness range | 10 nm – 100 um |
| Resolution | 0.1 nm |
| Repetability | 0.3 nm |
| Absolute accuracy | < 1 % (100 nm – 10 um) |
| Number of layers | up to 10 layers |
| Distance with fiber | 1 – 5 mm |
| Distance with optic | 5 – 100 mm |
| Angle with optic | 90° (nominal incidence) |
| Spot size | 400 um (optional 100/200 um |
| Microspot | 1 – 20 um with microscope 10× / 20× / 50× magnification and MFA – Adapter |
| Fiber length | 2 m (other lengths available on request) |
Documents
Here is place for your documents.
+420 54114 9207
nano@ceitec.vutbr.cz
