LiteScope 1.0 (LITESCOPE-LYRA)


LiteScope 1.0

Instrument status:
Operational Operational, 4.6.2024 16:45

Equipment placement:
Vysoké učení technické v Brně, CEITEC


A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.


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