NanoScan VLS-80 (NANOSCAN)

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation. Measurements can be conducted in-plane (<200mT) or out-of-plane magnetic field (<550mT). All standard AFM modes are available, An upgrade for Scanning Thermal Microscopy, Conductive AFM, and Scanning Spreading Resistance Microscopy is possible.

Publications:

• Kovařík, M., 2025: Fabrication of functional nanostructures and their analysis by surface-sensitive techniques. PH.D. THESIS , p. 1 - 104; FULL TEXT
  (NANOSCAN)
• KOVAŘÍK, M.; CITTERBERG, D.; PAIVA DE ARAÚJO, E.; ŠIKOLA, T.; KOLÍBAL, M., 2024: Understanding the Effect of Electron Irradiation on WS2 Nanotube Devices to Improve Prototyping Routines. ACS APPLIED ELECTRONIC MATERIALS 6(12), p. 8776 - 7, doi: 10.1021/acsaelm.4c01450; FULL TEXT
  (ALD-FIJI, MIRA-EBL, EVAPORATOR, MPS150, KEITHLEY-4200, LYRA, LITESCOPE-LYRA, WITEC-RAMAN, WIRE-BONDER, NANOSCAN)