NanoScan VLS-80 (NANOSCAN)

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 combines uniquely high vacuum SPM performance with high precision sample navigation. Measurements can be conducted in-plane (<200mT) or out-of-plane magnetic field (<550mT). All standard AFM modes are available, An upgrade for Scanning Thermal Microscopy, Conductive AFM, and Scanning Spreading Resistance Microscopy is possible.