UV/Vis/NIR Spectrophotometer Jasco V-770 (JASCO)


Guarantor:
Kateřina Tmejová

Instrument status:
Operational Operational, 2.2.2024 12:59

Equipment placement:
CEITEC Nano - B1.21


The UV/Vis/NIR Spectrophotometer Jasco V-770 has a unique single monochromator able to measure the wavelength range of 190 to 2700 nm. A PMT detector is used for the UV/ Vis region, and a Peltier-cooled PbS detector is for the NIR region. Thanks to a very friendly software manager, the device operation is easy. The Spectra Manager II allows measuring a) the spectra automatically at preselected time intervals using the preprogrammed parameters, b) the „Band gap” analysis program for energy calculations from transmission and reflection spectra of semiconductors, c) the program for determination of UV-B/UV-A protection grade of cosmetics, clothing and sunglasses.


Publications:

Photogallery

Specification


Specification of JASCO V-770 double-beam UV/Vis/NIR Spectrophotometer:
Wavelength range:190–2700 nm
Light source:deuterium and wolfram-halogen lamp
Slew (wavelength change) speed:12000 nm/min (UV-Vis region), 48000 nm/min (NIR region)
Variable scan speed:10–4000 nm/min, 8000 nm/min in preview mode
Photometric accuracy:±0.0015 AU (0-0.5 AU)
Photometric repeatability:±0.0005 AU (0-0.5 AU)
RMS noise:0.00003 AU (0 AU, 500 nm)
Baseline stability:± 0.0003 AU/hour


Widespread accessories facilitate the measuring of different types of samples (biological materials, science materials, or routine QA/QC measurement).

The following accessories are available in CEITEC Nano ChemLab:

ND filter to measure high-absorbance liquids.
Cell holders for standard spectrophotometric cuvettes.
Cell holder for long path rectangular cuvettes (for 10, 20, 50, and 100 mm cuvettes).
60 mm integrating spheres with barium sulfate coating, transmittance measurement: in cells for liquids (holder for 5–50 mm cell), reflectance measurement: solid samples (min. 20x20 mm, max: 65x50 mm sample size, 0,5–25 mm sample thickness) with/without specular reflection.
The powder sample holder for integrating the sphere, the diameter of the measuring area: 16 mm, sample thickness 0.5–6 mm.
Specular reflectance accessory, angle of incidence: ~5º, with sample and reference mirror, with special cover for sample compartment, wavelength range 250–1000 nm. Maximum sample size: sample size 100x120 mm, reference side 20x20 mm.  Recommended for film thickness measurements.
The sample holder with 2 mm diameter aperture.
The sample holder with 4 mm diameter aperture.
The cell holder for reference cuvette (5–20 mm).
The cut-off filter for fluorescence cut-off.

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