Ultra High Vacuum Preparation and Analytical System - Scanning Probe Microscopy SPECS Aarhus 150 SPM (UHV-SPM)


Guarantor:
Josef Polčák, Ph.D.

Instrument status:
Operational Operational, 21.8.2023 14:31

Equipment placement:
CEITEC Nano - C1.38


The chamber for STM and AFM scanning probe techniques (UHV-SPM) is one of the instruments of the UHV-Cluster, which combines preparation and in-situ analysis by several complementary methods for the characterization of surfaces and thin films. The UHV-SPM is equipped with the SPM Aarhus 150 working in of range 90–400K and provides the possibility of Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), achieving an atomic resolution on metal, semiconductor, and oxide surfaces.


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