UHV Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100 (UHV-LEIS)

The low-energy ion scattering spectroscope (LEIS) system is one of the instruments of the UHV-Cluster, which combines preparation and in-situ analysis by several complementary methods for the characterization of surfaces and thin films. The LEIS instrument provides the possibility of analysis of the elemental composition of a top-most surface layer via energy spectroscopy of back-scattered noble gas ions. Equipment: He, Ne, Ar ion sources, full azimuth acceptance analyzer for enhanced sensitivity, atomic oxygen source for sample cleaning, independent load-lock chamber.

Publications:

• PINDER, J.; MALATINOVÁ, M.; KOVAŘÍK, M.; AUSTIN, D.; ŠIKOLA, T.; TOUGAARD, S.; MORGAN, D.; ISAACS, M.; PRŮŠA, S.; LINFORD, M., 2025: Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering. SURFACE AND INTERFACE ANALYSIS 57(4), p. 264 - 274, doi: 10.1002/sia.7378; FULL TEXT
  (UHV-LEIS)
• PRAJZLER, V.; GUO, Z.; PRŮŠA, S.; TODD, R., 2025: Residual chlorine prevents full densification of 3 mol% yttria-stabilized zirconia ceramics during ultrafast high-temperature sintering (UHS). JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 45(16), p. 1 - 6, doi: 10.1016/j.jeurceramsoc.2025.117709; FULL TEXT
  (VERIOS, UHV-LEIS)
• VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T., 2024: . NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIO 553, doi: 10.1016/j.nimb.2024.165385; FULL TEXT
  (UHV-MBE, UHV-LEIS, UHV-XPS)
• PRŮŠA, S.; LINFORD, M.; VANÍČKOVÁ, E.; BÁBÍK, P.; PINDER, J. W:; ŠIKOLA, T.; BRONGERSMA, H., 2024: . APPLIED SURFACE SCIENCE , doi: 10.1016/j.apsusc.2023.158793; FULL TEXT
  (UHV-LEIS)
• STANĚK, J.; PRŮŠA, S.; STRAPKO, T.; ŠIKOLA, T., 2024: . SURFACE SCIENCE SPECTRA 31(2), doi: 10.1116/6.0003869; FULL TEXT
  (UHV-LEIS)

• AVVAL, T.; PRŮŠA, S.; ČECHAL, J.; CUSHMAN, C. V.; HODGES, G. T.; FEARN, S.; KIM, S. H.;ČECHAL, J.; VANÍČKOVÁ, E.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. H.; LINFORD, M. R., 2023: . APPLIED SURFACE SCIENCE 607, p. 154551 - 9, doi: 10.1016/j.apsusc.2022.154551; FULL TEXT
  (UHV-LEIS, UHV-XPS)
• MOTYČKOVÁ, L.; ARREGI URIBEETXEBARRIA, J.; STAŇO, M.; PRŮŠA, S.; ČÁSTKOVÁ, K.; UHLÍŘ, V., 2023: . ACS APPLIED MATERIALS & INTERFACES 15(6), p. 8653 - 13, doi: 10.1021/acsami.2c20107; FULL TEXT
  (MAGNETRON, VERSALAB, RIGAKU9, UHV-LEIS, VERIOS, ICON-SPM)
• Moeini, B.; Avval, TG.; Brongersma, HH.; Prusa, S.; Babik, P.; Vanickova, E.; Strohmeier, BR.; Bell, DS.; Eggett, D.; George, SM.; Linford, MR., 2023: . MATERIALS 16(13), doi: 10.3390/ma16134688; FULL TEXT
  (UHV-LEIS)
• VANÍČKOVÁ, E.; PRŮŠA, S.; ŠIKOLA, T., 2023: . SURFACE SCIENCE SPECTRA 30(2), p. 1 - 15, doi: 10.1116/6.0002669; FULL TEXT
  (UHV-LEIS, UHV-PREPARATION)
• Moeini, B.; Pinder, JW.; Avval, TG.; Jacobsen, C.; Brongersma, HH.; Prusa, S.; Bábik, P.; Vanicková, E.; Argyle, MD.; Strohmeier, BR.; Jones, B.; Shollenberger, D.; Bell, DS.; Linford, MR., 2023: . JOURNAL OF CHROMATOGRAPHY A 1707, doi: 10.1016/j.chroma.2023.464248; FULL TEXT
  (UHV-LEIS)
• Alcala, R.; DeLaRiva, A.; Peterson, E. J.; Benavidez, A.; Garcia-Vargas, C. E.; Jiang, D.; Pereira-Hernández, X. I.; Brongersma, H. H.; ter Veen, R.; Staněk, J.; Miller, J. T.; Wang, Y.; Datye, A., 2021: . APPLIED CATALYSIS B: ENVIRONMENTAL 284, p. 1 - 9, doi: 10.1016/j.apcatb.2020.119722
  (UHV-LEIS)
• AVVAL, T. G.; PRŮŠA, S.; CHAPMAN, S. C.; LINFORD, M. R.; ŠIKOLA, T.; BRONGERSMA, H. H., 2021: . SURFACE SCIENCE SPECTRA 28(1), p. 1 - 8, doi: 10.1116/6.0000953; FULL TEXT
  (UHV-LEIS)
• UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F., 2020: . APPLIED SURFACE SCIENCE 514, p. 145923-1 - 7, doi: 10.1016/j.apsusc.2020.145923; FULL TEXT
  (MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)
• FIKÁČEK, J.; PROCHÁZKA, P.; STETSOVYCH, V.; PRŮŠA, S.; VONDRÁČEK, M.; KORMOŠ, L.; SKÁLA, T.; VLAIC, P.; CAHA, O.; CARVA, K.; ČECHAL, J.; SPRINGHOLZ, G.; HONOLKA, J., 2020: . NEW JOURNAL OF PHYSICS 22(7), p. 1 - 12, doi: 10.1088/1367-2630/ab9b59; FULL TEXT
  (UHV-LEEM, UHV-XPS, UHV-LEIS, UHV-DEPOSITION, UHV-PREPARATION)
• PRŮŠA, S.; BÁBÍK, P.; MACH, J.; STRAPKO, T.; ŠIKOLA, T.; BRONGERSMA, H., 2020: . SURFACE SCIENCE SPECTRA 27(2), p. 1 - 13, doi: 10.1116/6.0000325; FULL TEXT
  (UHV-LEIS)
• PRŮŠA, S.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H., 2020: . SURFACE AND INTERFACE ANALYSIS , p. 1000 - 4, doi: 10.1002/sia.6889; FULL TEXT
  (UHV-LEIS)
• PRAJZLER, V.; PRŮŠA, S.; MACA, K., 2019: . JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 39(16), p. 5309 - 11, doi: 10.1016/j.jeurceramsoc.2019.07.053; FULL TEXT
  (VERIOS, UHV-LEIS)
• Sekula, F., 2019: . BACHELOR'S THESIS ; FULL TEXT
  (UHV-LEIS)
• REDONDO, J.; LAZAR, P.; PROCHÁZKA, P.; PRŮŠA, S.; MALLADA, B.; CAHLÍK, A.; LACHNITT, J.; BERGER, J.; ŠMÍD, B.; KORMOŠ, L.; JELÍNEK, A.; ČECHAL, J.; ŠVEC, M., 2019: . JOURNAL OF PHYSICAL CHEMISTRY C (PRINT) 123(23), p. 14312 - 7, doi: 10.1021/acs.jpcc.9b00244; FULL TEXT
  (UHV-PREPARATION, UHV-LEEM, UHV-LEIS)
• ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J., 2018: . VACUUM 152, p. 138 - 7, doi: 10.1016/j.vacuum.2018.03.014; FULL TEXT
  (UHV-LEIS, KRATOS-XPS)
• Bábík, P., 2018: . MASTER'S THESIS , p. 1 - 55
  (UHV-LEIS)
• Horký, M., 2016: . MASTER'S THESIS , p. 1 - 96
  (UHV-PREPARATION, UHV-XPS, UHV-SPM, VERIOS, UHV-LEIS, RIGAKU3, LYRA, ICON-SPM, KRATOS-XPS)
• PRŮŠA, S.; PROCHÁZKA, P.; BÁBOR, P.; ŠIKOLA, T.; TER VEEN, R.; FARTMANN, M.; GREHL, T.; BRÜNER, P.; ROTH, D.; BAUER, P.; BRONGERSMA, H., 2015: . LANGMUIR 31(35), p. 9628 - 8, doi: 10.1021/acs.langmuir.5b01935; FULL TEXT
  (UHV-LEIS)