LVEM 25E (LVEM)

The LVEM 25E (Low Voltage Electron Microscope) is a versatile and easy-to-use FEG-type transmission electron microscope (TEM) that combines several imaging modes: transmission mode, electron diffraction mode, scanning transmission mode, and SEM-like scanning mode (BSE detector only), providing the nanometer level resolution. The microscope is also equipped with energy dispersive X-ray spectrometer (EDS) for elemental analysis. It is designed to measure conventionally prepared TEM samples, especially those of low contrast and low atomic number materials (organic matter, polymers). Samples can be thin sections, thin foils, or fine particles dispersed on a standard supporting TEM grid with a diameter of 3.05 mm. High contrast of the light elements is achieved using significantly lower electron energy (25 kV) compared to standard TEM (60-300 kV). Considering this, the sample must be sufficiently thin to image objects containing heavy elements. The maximum thickness of the sample has to be up to 120 nm for low Z samples, ca 20 nm for metals for TEM mode, and up to 200 nm for low Z samples for STEM mode.