Ion polisher Fischione TEM Mill 1050 (FISCHIONE-TEM-MILL)
Guarantor:
Jiří Holas
Instrument status:
Operational, 15.11.2023 10:34
Equipment placement:
CEITEC Nano - A1.08
Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with a CCD camera for better specimen viewing and polishing process control.
Publications:
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ZBONČÁK, M.; ONDREÁŠ, F.; UHLÍŘ, V.; LEPCIO, P.; MICHALIČKA, J.; JANČÁŘ, J., 2020: Translation of segment scale stiffening into macro scale reinforcement in polymer nanocomposites. POLYMER ENGINEERING AND SCIENCE 60(3), p. 587 - 10, doi: 10.1002/pen.25317; FULL TEXT
(MIRA-STAN, FISCHIONE-TEM-MILL, CRYOGENIC)
Photogallery
Specification
Ion source | Two ion guns, single controllable |
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Ion source energy | from 100 eV to 6 keV |
Beam current density | up to 10 mA/cm2 |
Process gas | Argon, 99,999 % purity |
Specimen stage
Milling angle range | –10° to +10° |
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Specimen rotation | available with motion sequencing |
Specimen rocking | available |
Documents
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