Ultra High Vacuum Preparation and Analytical System - Molecular Beam Epitaxy SPECS (UHV-MBE)


Guarantor:
Josef Polčák, Ph.D.

Instrument status:
Operational Operational, 24.11.2023 14:04, Info allert test

Equipment placement:
CEITEC Nano - C1.38


The molecular beam epitaxy preparation chamber (UHV-MBE) is one of the instruments of the UHV-Cluster, which combines preparation and in-situ analysis by several complementary methods for the characterization of surfaces and thin films. It is used exclusively for depositions of III-V materials (Ga, In, Al, As, Sb; C, Si for doping) for epitaxial growth of semiconductor thin films and heterostructures (GaAs, InAs) and nanowires. It is equipped with a RHEED system for real-time layer growth measurement, sample heating by electron beam heater up to 800°C (1200 °C for short time), a pyrometer for temperature measurement, and quartz viewports for attaching an ellipsometer.


Publications:

Photogallery

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