Services for academic users

For occasional users, where training is unfeasible, full-service processing of user’s samples can be provided by CEITEC Nano staff. Full-service users do not not need any training, their samples are handled by CEITEC Nano staff. They can be present at the measurement only as visitors under the supervision of an authorized personnel.

How to order full-service

  1. Contact the CEITEC Nano User Office at or via phone 54114 9200 to discuss your processing requirements.
  2. CEITEC Nano financial department will send you a quotation for CEITEC Nano services. We provide support regarding internal invoicing from projects running at CEITEC and BUT. Contact CEITEC Nano financial manager Pavlina Zajicova (+420 51118 1252) with your questions.
  3. If you agree with the quotation send the purchase order to
  4. CEITEC Nano staff will process your samples and prepare a processing/measurement report.
  5. Upon agreement an invoice will be emailed to you together with the samples or measurement data.

Prices for academic users

Academic users using full-service pay hourly rates (listed below) for the instrument use and an additional fee for the analysis of the results (if requested).

Nanofabrication laboratory

E-beam writer RAITH RAITH150 Two1 500
Scanning Electron Microscope/E-beam writer TESCAN MIRA31 300
UV Direct Write Laser system Heidelberg Instruments DWL 66-fs1 300
Other lithography equipment1 200
Etching and depositionCZK/hour
Reactive ion etching system Oxford Instruments PlasmaPro NGP 801 200
Ion beam etching Scia Systems Coat 2001 200
Atomic layer deposition system Ultratech Fiji 2001 000
Electron beam evaporator BESTEC1 000
UHV magnetron sputtering system BESTEC1 000
Packaging    CZK/hour
Laser wafer dicer Oxford Lasers A-Series1 200
Wire bonder TPT HB 16

1 000

Nanocharacterization laboratory

UHV technologiesCZK/hour
Scanning Auger Microscopy Scienta Omicron nanoSAM Lab1 800
Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS51 800
Low Energy Ion Spectroscopy ION-TOF Qtac 1001 300
X-ray photoelectron spectroscopy Kratos Axis Supra1 800
Microscopy and nanomanipulationCZK/hour
Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 1 2001 500
Scanning Probe Microscope Bruker Dimension Icon1 300
Optical measurements​CZK/hour
MIR spectroscopic ellipsometer J. A. Woollam IR-VASE1 200
NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE1 200
SPM + microRaman NT-MDT Ntegra Spectra + Solar II1 200
Vacuum FTIR, IR microscope Bruker Vertex80v + Hyperion1 200
Vacuum ultraviolet spectrometer McPherson VUVAS 10001 200
Electrical and magnetic measurementsCZK/hour
Low temperature measurement system Cryogenic mini-CFMS1 200
Low temperature measurement system LakeShore CRX-EM-HF1 200
4-probe station Cascade Microtech MPS 1501 200
Semi-automated 4-probe system Cascade Microtech SUMMIT 120001 200

Structural analysis laboratory

Electron microscopyCZK/hour
High resolution Scanning Electron Microscope FEI Verios 460L 1 4001 900
Dual beam FEI Helios NanoLab 660 1 7002 000
HRTEM FEI Titan Themis 60-300 cubed 2 7003 000
Sample preparation 1 0001 200
X-ray diffractometryCZK/hour
X-ray diffractometer with high brightness source Rigaku SmartLab 9kW1 200
X-ray powder diffractometer Rigaku SmartLab 3kW1 200

Micro- and Nano CT laboratory

micro & nano CT                                                                                                           CZK/hour
microCT GE phoenix L 240, GE phoenix M 3002 200
nanoCT Rigaku Nano3DX3 000

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