Equipment training

23.1.2020 10:00-12:00
Přihlásit se na školení Základní měření FTIR(Vertex70 a Hyperion) - IR reflectometry under vacuum and in microscope setup

24.1.2020 09:30-13:00
Přihlásit se na školení IBE -training

24.1.2020 12:30-16:30
Přihlásit se na školení KRATOS-XPS - Basic training session 1/2.

28.1.2020 09:00-12:00
Přihlásit se na školení Verios_basic - Verios_basic: training for new users. Meeting point: foyer in 1st floor in building A.

29.1.2020 08:00-16:00
Přihlásit se na školení LYRA basic training - We will meet in the coffee room at the same floor as laboratories (building C).

29.1.2020 08:00-16:00
Přihlásit se na školení LYRA basic training - We will meet in the coffee room at the same floor as laboratories (building C).

If the training which you are interested in is not not scheduled yet, please contact instrument guarantor via e-mail and he/she will schedule it. The training is typically announced few weeks in advance in order to give an opportunity to join also to other users.

Typical timelines for scheduling trainings are:

  • For basic trainings: 14–28 days from the first request
  • For advanced trainings: 28–56 days from the first request

In urgent, well reasoned cases it is possible to schedule an extra training on demand (depends on guarantor availability).

If you have any comments or feedback to our training scheduling or procedures, please use our (anonymous if needed) feedback system

Training for equipment is available for registered users via the booking system .

List of all training

Atomic layer deposition system Ultratech/CambridgeNanoTech Fiji 200

Coater Leica EM ACE600

E-beam writer RAITH150 Two  (RAITH)

Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660

Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3

Grinder/polisher Tegramin 30

  • Tegramin_standard

High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)

  • Verios_basic

Hysitron TI 950 (NANOINDENTER)

Keithley 4200-SCS Parameter Analyzer (KEITHLEY-4200)


Lithographic wet bench development Stroza & Lithographic wetbench for stripping Stroza

  • Lithographic wet benches for development & stripping

Lithographic wet bench for resist coating SÜSS MicroTec

Mask Aligner SÜSS MicroTec MA8  (SUSS-MA8)

Mechanical profilometer Bruker Dektak XT

  • Basic control of DektakXT (DektakXT basics)

Metallographic saw Labotom 5

  • Labotom_standard

Mini Cryogen-Free Magnet System - Cryogenic Limited  (CRYOGENIC)

MIR spectroscopic ellipsometer J. A. Woollam IR-VASE

  • Ellipsometry

Mounting press Citopress 10

  • Citopress_standard

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE

  • Elipsometr V-VASE - standard

Precision saw Accutom 100

  • Accutom_standard

Resist stripper Diener electronic NANO Plasma cleaner

  • Resist Stripper

Scanning Electron Microscope/E-beam writer TESCAN MIRA3

Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000

  • SNOM MV4000 standard
  • SNOM MV4000 advanced

Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II

  • SPM NTegra Spectra - standard (SPM - standard AFM)
  • uRaman/PhotoLuminiscent system NTegra Spectra - standard (NTegra Spectra - standard Raman)

Scanning Probe Microscope Bruker Dimension Icon

  • Lithographic SPM Dimension Icon SPM standard (Icon Standard)

Spectroscopic reflectometer Ocean Optics NanoCalc 2000

UV Direct Write Laser system Heidelberg Instruments DWL 66-fs

Vacuum FTIR Vertex80v + microscope Hyperion 3000 KIT - polarizors, VIS detector Bruker Vertex80v + Hyperion 3000

  • Vacuum FTIR (Vacuum FTIR)
  • Vacuum FTIR microscope (Vacuum FTIR microscope)

Vacuum ultraviolet spectrometer McPherson VUVAS 1000

  • VUV spectrometer VUVAS 1000 (VUVAS 1000)

Wire bonder TPT HB 16

X-ray diffractometer with high brightness source Rigaku SmartLab 9kW

  • Difraktometr Rigaku 9kW - basic (Rigaku 9kW - basic)
  • Difraktometr Rigaku 9kW - advanced (Rigaku 9kW - advanced)

X-ray powder diffractometer Rigaku SmartLab 3kW

  • Difraktometr Rigaku 3kW - measurement with assistance (basic, standard) (Difraktometr Rigaku 3kW)
  • Difraktometr Rigaku 3kW - measurement without assistance (advanced) (Difraktometr Rigaku 3kW)

X-ray Photoelectron Spectroscopy Kratos Analytical Axis Supra  (KRATOS-XPS)