Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000 (SNOM-NANONICS)
Petr Dvořák, Ph.D.
Operational, 9.2.2018 17:18
SNOM is a microscopic tool, which breaks the far-field light resolution limit by mapping the near-field light (evanescent waves) distribution of nanostructures. In order to achieve this, there is a very sharp optical probe (detectors/illuminators), which has an aperture of tens of nanometers. This scans the sample surface at a distance much smaller than the wavelengths of the light interacting with it. The optical resolution and structure size resolution is limited by the probe size, not by the wavelength of the incidental light (resolution ~100 nm).
This technique provides for the capabilities of the basic experimental setup – illumination by a SNOM probe set to collect interacting light in reflection or transmission; to illuminate a sample in transmission or reflection and collection the interacting light via a SNOM probe.
Horak, M; Krapek, V; Hrton, M; Konecna, A; Ligmajer, F; Stoger-Pollach, M; Samoril, T; Patak, A; Edes, Z; Metelka, O; Babocky, J; Sikola, T, 2019: Limits of Babinet´s principle for solid and hollow plasmonic antennas. SCIENTIFIC REPORTS 9, p. 4004-1 - 4004-11, doi: 10.1038/s41598-019-40500-1
(FTIR, HELIOS, LYRA, MAGNETRON, SNOM-NANONICS, TITAN)
Ligmajer, F., 2018: Advanced plasmonic materials for metasurfaces and photochemistry. PH.D. THESIS , p. 1 - 142
(VERIOS, ICON-SPM, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN)
Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
(SNOM-NANONICS, LYRA, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS)
Dvořák, P.; Kvapil, M.; Bouchal, P.; Édes, Z.; Šamořil, T.; Hrtoň, M.; Ligmajer, F.; Křápek, V.; Šikola, T., 2018: Near-field digital holography: a tool for plasmon phase imaging. NANOSCALE 10(45), p. 21363 - 21368, doi: 10.1039/C8NR07438K
Dvorak, P; Edes, Z; Kvapil, M; Samoril, T; Ligmajer, F; Hrton, M; Kalousek, R; Krapek, V; Dub, P; Spousta, J; Varga, P; Sikola, T, 2017: Imaging of near-field interference patterns by aperture-type SNOM - influence of illumination wavelength and polarization state. OPTICS EXPRESS 25(14), p. 16560 - 16573, doi: 10.1364/OE.25.016560
(LYRA, EVAPORATOR, SNOM-NANONICS)
Nanonics MultiView 4000
Multi-probe independentScanning Probe Microscope (SPM) fully integreated with upright and inverted optical microscope.
|SPM techniques – SNOM, Atomic Force Microscopy (AFM), conductive AFM, Scanning Tunneling Microscopy (STM)||
|Two – independent probe scanning system, sample scanning||
Combined SNOM collection, illumination with reflection and transmission modes
|Probes – bent optical fibers on tuning fork according to applications||
|Optical and acoustic hoods||
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