Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000 (SNOM-NANONICS)
Guarantor:
Petr Viewegh, Ph.D.
Instrument status:
Operational, 9.2.2018 17:18
Complex microscopy and analysis of surfaces, (ultra)thin films and micro/nanostructures mostly ex situ monitoring of semi-products prepared in individual steps of technologies available at CEITEC or outside. Microscopy provided by an advanced electron beam microscopy and top scanning probe techniques. Analysis based on the key surface science methods like XPS, AES and SIMS. Utilizing ion beam sputtering in surface cleaning and depth profiling of (ultra)thin films.
Publications:
-
ROVENSKÁ, K.; LIGMAJER, F.; IDESOVÁ, B.; KEPIČ, P.; LIŠKA, J.; CHOCHOL, J.; ŠIKOLA, T., 2023: Structural color filters with compensated angle-dependent shifts. OPTICS EXPRESS 31(26), p. 43048 - 9, doi: 10.1364/OE.506069; FULL TEXT
(EVAPORATOR, MIRA-EBL, RIE-CHLORINE, ALD, SNOM-NANONICS, TUBE-FURNACE) -
LIŠKA, J.; HUDEC, R.; MIKULÁŠEK, Z.; ZEJDA, M.; JANÍK, J.; ŠTROBL, J., 2022: CZEV502-AN M DWARF NEAR THE LEO TRIPLET WITH VERY STRONG FLARES. REVISTA MEXICANA DE ASTRONOMIA Y ASTROFISICA 58(1), p. 155 - 14, doi: 10.22201/ia.01851101p.2022.58.01.12; FULL TEXT
(SNOM-NANONICS) -
DVOŘÁK, P.; KLOK, P.; KVAPIL, M.; HRTOŇ, M.; BOUCHAL, P.; KRPENSKÝ, J.; KŘÁPEK, V.; ŠIKOLA, T., 2022: Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices. NANOPHOTONICS 11(19), p. 1 - 12, doi: 10.1515/nanoph-2022-0215; FULL TEXT
(SNOM-NANONICS, LYRA) -
Liška, P., 2021: Optical characterization of advanced nanomaterials with a high lateral resolution. MASTER´S THESIS , p. 1 - 91; FULL TEXT
(NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, KRATOS-XPS, SIMS) -
Kepič, P., 2021: Design and fabrication of tunable dielectric metasurfaces for visible and infrared wavelengths. MASTER´S THESIS , p. 1 - 76; FULL TEXT
(MIRA-EBL, EVAPORATOR, DEKTAK, WITEC-RAMAN, KRATOS-XPS, SNOM-NANONICS, LYRA, ICON-SPM)
-
Babocký, J., 2020: Fabrication and characterization of nanostructures with functional properties in the field of plasmonics. PH.D. THESIS , p. 1 - 104; FULL TEXT
(MIRA-EBL, RAITH, EVAPORATOR, SNOM-NANONICS, ICON-SPM) -
HORÁK, M.; KŘÁPEK, V.; HRTOŇ, M.; KONEČNÁ, A.; LIGMAJER, F.; STÖGER-POLLACH, M.; ŠAMOŘIL, T.; PATÁK, A.; ÉDES, Z.; METELKA, O.; BABOCKÝ, J.; ŠIKOLA, T., 2019: Limits of Babinet’s principle for solid and hollow plasmonic antennas. SCIENTIFIC REPORTS 9, p. 1 - 11, doi: 10.1038/s41598-019-40500-1; FULL TEXT
(FTIR, HELIOS, MAGNETRON, SNOM-NANONICS, TITAN, LYRA) -
DVOŘÁK, P.; KVAPIL, M.; BOUCHAL, P.; ÉDES, Z.; ŠAMOŘIL, T.; HRTOŇ, M.; LIGMAJER, F.; KŘÁPEK, V.; ŠIKOLA, T., 2018: Near-field digital holography: a tool for plasmon phase imaging. NANOSCALE 10(45), p. 21363 - 7, doi: 10.1039/c8nr07438k; FULL TEXT
(SNOM-NANONICS, LYRA) -
Ligmajer, F., 2018: Advanced plasmonic materials for metasurfaces and photochemistry. PH.D. THESIS , p. 1 - 142
(VERIOS, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN, ICON-SPM) -
Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
(SNOM-NANONICS, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS, LYRA) -
DVOŘÁK, P.; ÉDES, Z.; KVAPIL, M.; ŠAMOŘIL, T.; LIGMAJER, F.; HRTOŇ, M.; KALOUSEK, R.; KŘÁPEK, V.; DUB, P.; SPOUSTA, J.; VARGA, P.; ŠIKOLA, T., 2017: Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state. OPTICS EXPRESS 25(14), p. 16560 - 13, doi: 10.1364/OE.25.016560; FULL TEXT
(EVAPORATOR, SNOM-NANONICS, LYRA)
Photogallery
Specification
Nanonics MultiView 4000
Multi-probe independentScanning Probe Microscope (SPM) fully integreated with upright and inverted optical microscope.
Features
SPM techniques – SNOM, Atomic Force Microscopy (AFM), conductive AFM, Scanning Tunneling Microscopy (STM) |
|
---|---|
Two – independent probe scanning system, sample scanning |
|
Combined SNOM collection, illumination with reflection and transmission modes
|
|
Probes – bent optical fibers on tuning fork according to applications |
|
Liquid cell |
|
Optical and acoustic hoods |
|
Documents
Here is place for your documents.