LiteScope 1.0 (LITESCOPE-LYRA)

A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.

Publications:

• UKROPCOVÁ, I.; DAO, R.; ŠTUBIAN, M.; KOLÍBAL, M.; ŠIKOLA, T.; WILLINGER, M.; WANG, Z.; ZLÁMAL, J.; BÁBOR, P., 2023: Electron Tractor Beam: Deterministic Manipulation of Liquid Droplets on Solid Surfaces. ADVANCED MATERIALS INTERFACES 10(2), doi: 10.1002/admi.202201963; FULL TEXT
  (NANOSAM, LITESCOPE-LYRA, MIRA-STAN)
• SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J., 2023: Superflux of an organic adlayer towards its local reactive immobilization. COMMUNICATIONS CHEMISTRY 6(1), doi: 10.1038/s42004-023-01020-2; FULL TEXT
  (KRATOS-XPS, SIMS, LYRA, LITESCOPE-LYRA)
• Novotný, O., 2021: Correlated probe and electron microscopy for the study of modern magnetic nanomaterials. MASTER´S THESIS , p. 1 - 88; FULL TEXT
  (LITESCOPE-LYRA, LYRA)
• NOVOTNÁ, V., HORÁK, J., KONEČNÝ, M., HEGROVÁ, V., NOVOTNÝ, O., NOVÁČEK, Z., NEUMAN, J., 2020: AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis. MICROSCOPY TODAY , p. 38 - 9, doi: 10.1017/S1551929520000875; FULL TEXT
  (MIRA-STAN, LITESCOPE-LYRA)
• SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
  (SIMS, WITEC-RAMAN, LITESCOPE-LYRA, KRATOS-XPS, LYRA)

• Hegrová, V., 2019: Application of correlative AFM/SEM microscopy. MASTER´S THESIS , p. 1 - 64
  (LITESCOPE-LYRA, MIRA-EBL, RIE-FLUORINE, EVAPORATOR, WIRE-BONDER, LYRA)