MIR spectroscopic ellipsometer J. A. Woollam IR-VASE (WOOLLAM-MIR)
Instrument status:
Operational, 9.2.2018 16:48
Equipment placement:
CEITEC Nano - C1.21
The spectroscopic ellipsometer covers the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). The WOOLLAM-MIR offers non-contact measurements of many different material properties including thickness, optical constants, material composition, chemical bonding, doping concentration and more. Measurements do not require vacuum and can be used to study liquid/solid interfaces common in biological and chemical applications.
Publications:
-
Duchaň; M., 2023: Study of optical response of ferromagnetic manganese oxides. BACHELOR´S THESIS , p. 1 - 31; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9) -
GALLINA, P.; KVAPIL, M.; LIŠKA, J.; KONEČNÁ, A.; KŘÁPEK, V.; KALOUSEK, R.; ZLÁMAL, J.; ŠIKOLA, T., 2023: Strong coupling in an Au plasmonic antenna-SiO2 layer system: A hybrid-mode analysis. PHYSICAL REVIEW B 107(12), p. 125144 - 6, doi: 10.1103/PhysRevB.107.125144; FULL TEXT
(ALD, EVAPORATOR, MIRA-EBL, FTIR, NANOCALC, DEKTAK, WOOLLAM-MIR, ICON-SPM) -
Hale, N.; Hartl, M.; Humlicek, J.; Brüne, C.; Kildemo, M., 2023: Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry. OPTICAL MATERIALS EXPRESS 13(7), p. 2020 - 16, doi: 10.1364/OME.493426; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS) -
Kelarová, Š., 2023: Organosilicon coatings based on trimethylsilyl acetate monomer prepared using plasma of RF capacitively coupled glow discharge. PH.D. THESIS , p. 1 - 182; FULL TEXT
(WOOLLAM-MIR, FTIR, KRATOS-XPS, SIMS) -
Zahradník, M.; Kiaba, M.; Espinoza, S.; Rebarz, M.; Andreasson, J.; Caha, O.; Abadizaman, F.; Munzar, D.; Dubroka, A., 2022: Photoinduced insulator-to-metal transition and coherent acoustic phonon propagation in LaCoO3 thin films explored by femtosecond pump-probe ellipsometry. PHYSICAL REVIEW B 105(23), doi: 10.1103/PhysRevB.105.235113; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9)
-
Franta, D.; Mureșan, M.-G., 2021: Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model. OPTICAL MATERIALS EXPRESS 11(12), doi: 10.1364/OME.441088; FULL TEXT
(WOOLLAM-MIR, FTIR-CHEMLAB) -
Mohelský, I.; Dubroka, A.; Wyzula, J.; Slobodeniuk, A.; Martinez, G.; Krupko, Y.; Piot, B. A.; Caha, O.; Humlíček, J.; Bauer, G.; Springholz, G.; Orlita, M., 2020: Landau level spectroscopy of Bi2Te3. PHYSICAL REVIEW B 102(8), p. 085201-1 - 085201-11, doi: 10.1103/PhysRevB.102.085201
(WOOLLAM-MIR, FTIR) -
Mohelský, I., 2020: Infrared magneto–spectroscopy of Bi2Te3 topological insulator. MASTER´S THESIS , p. 1 - 49
(FTIR, WOOLLAM-MIR, MAGNETRON, CRYOGENIC, KRATOS-XPS) -
LIGMAJER, F.; HORÁK, M.; ŠIKOLA, T.; FOJTA, M.; DAŇHEL, A., 2019: Silver Amalgam Nanoparticles and Microparticles: A Novel Plasmonic Platform for Spectroelectrochemistry. JOURNAL OF PHYSICAL CHEMISTRY C (PRINT) 123(27), p. 16957 - 8, doi: 10.1021/acs.jpcc.9b04124; FULL TEXT
(VERIOS, TITAN, FTIR, WOOLLAM-MIR) -
Konečný, A., 2019: Evaluation of Different Dielectrics For Mid-Infrared Waveguides. BACHELOR´S THESIS , p. 1 - 32; FULL TEXT
(MAGNETRON, PECVD, ALD, WOOLLAM-MIR) -
Friš, P.; Munzar, D.; Caha, O.; Dubroka, A., 2018: Direct observation of double exchange in ferromagnetic La0.7Sr0.3CoO3 by broadband ellipsometry. PHYSICAL REVIEW B 97(4), p. 045137-1 - 045137-5, doi: 10.1103/PhysRevB.97.045137
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9, FTIR, CRYOGENIC) -
Dubroka, A; Caha, O; Hroncek, M; Fris, P; Orlita, M; Holy, V; Steiner, H; Bauer, G; Springholz, G; Humlicek, J, 2017: Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). PHYSICAL REVIEW B 96(23), doi: 10.1103/PhysRevB.96.235202
(FTIR, RIGAKU9, WOOLLAM-MIR, WOOLLAM-VIS) -
Kukolova, A., 2017: Experimental study of electronic properties of manganites and electron stimulated desorption. MASTER´S THESIS , p. 1 - 91
(WOOLLAM-MIR, WOOLLAM-VIS, CRYOGENIC) -
Wang, CN; Caha, O; Munz, F; Kostelnik, P; Novak, T; Humlicek, J, 2017: Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. APPLIED SURFACE SCIENCE 421, p. 859 - 865, doi: 10.1016/j.apsusc.2017.02.056
(WOOLLAM-MIR, RIGAKU9, TERS)
Photogallery
Specification
Features
Spectral range |
1.7 to 30 microns (333 to 5900 wavenumbers)
|
---|---|
Sample holder | vertical |
Interferometer | FTLA 2000 |
Documents
Here is place for your documents.