Ultrafast laser-induced surface modification of Kanthal® AF: Morphology, chemistry, and wettability under ambient conditions

Ronoh, K.; Novotný, J.; Mrňa, L.; Knápek, A.; Šulák, I.; Sobola, D., 2026: . MATERIALS CHARACTERIZATION 234, doi: 10.1016/j.matchar.2026.116196; FULL TEXT
(VERIOS, DEKTAK, MIRA-STAN, KRATOS-XPS, WITEC-RAMAN, SEE-SYSTEM)

Equipment:

• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• Mechanical profilometer Bruker Dektak XT (DEKTAK)
• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Witec Alpha 300R (WITEC-RAMAN)
• See System E Advex Instruments (SEE-SYSTEM)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Prof. Dinara Sobola, Ph.D.
• Kipkurui Nickson Ronoh