Tescan AMBER X 2 (AMBER)
Guarantor:
Konstantin Iakoubovskii, Ph.D.
Instrument status:
Some Issues, 12.5.2026 08:40, EBSD is not working, the replacement part has been ordered from the US and should be installed on 28 May.
AMBER X2 is a dual-beam analytical system for imaging, analysis, fabrication and processing of materials at the nanoscale. It combines SEM, STEM, Xe plasma FIB, SIMS, EDS, EBSD and GIS systems.
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Specification
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Documents
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+420 54114 9207
nano@ceitec.vutbr.cz
