Tailoring Tungsten Oxide Layers for Cold Field Emission Cathodes: Anodization and Thermal Oxidation Approaches

ACS APPLIED ELECTRONIC MATERIALS

KOŠELOVÁ, Z.; ALLAHAM, M.; BURDA, D.; POKORNÁ, Z.; SOBOLA, D.; KNÁPEK, A.; FOHLEROVÁ, Z., 2025: Tailoring Tungsten Oxide Layers for Cold Field Emission Cathodes: Anodization and Thermal Oxidation Approaches. ACS APPLIED ELECTRONIC MATERIALS 7(9), p. 4013 - 4024, doi: 10.1021/acsaelm.5c00241; FULL TEXT
(HELIOS, KRATOS-XPS, MIRA-STAN, ICON-SPM)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Mohammad Allaham
• Dinara Sobola, Ph.D.