Surface topography affects the nanoindentation data

Plichta, T.; Zahradnicek, R.; Cech, V., 2022: . THIN SOLID FILMS 745, doi: 10.1016/j.tsf.2022.139105; FULL TEXT
(HELIOS, NANOINDENTER)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• Hysitron TI 950 (NANOINDENTER)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Radim Zahradníček, Ph.D.