Surface and Subsurface Layers Defects Analysis After WEDM Affecting the Subsequent Lifetime of Produced Components

Mouralova, K.; Prokes, T.; Benes, L., 2019: . ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING 44(9), p. 7723 - 7735, doi: 10.1007/s13369-019-03887-7
(TEGRAMIN, LYRA, ICON-SPM)

Equipment:

• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• CF: CEITEC Nano