Substrate-temperature-driven phase stabilization and strain modulation in BiFeO₃/Ti/Si heterostructures for scalable silicon integration

Journal of Alloys and Compounds

Fawaeer, S. H.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2025: Substrate-temperature-driven phase stabilization and strain modulation in BiFeO₃/Ti/Si heterostructures for scalable silicon integration. JOURNAL OF ALLOYS AND COMPOUNDS 1047, doi: 10.1016/j.jallcom.2025.184949; FULL TEXT
(VERIOS, KRATOS-XPS, ICON-SPM, WOOLLAM-VIS)

Equipment:

• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.