Structural analysis of imperfections in contacts of graphene chemiresistors

APPLIED SURFACE SCIENCE

KASPAR, P.; ŠIŠKA VIRÁGOVÁ, E.; DALLAEV, R.; PAPEŽ, N.; MACKŮ, R.; GRMELA, L.; ŠIK, O.; SEDLÁK, P.; SOBOLA, D., 2025: Structural analysis of imperfections in contacts of graphene chemiresistors. APPLIED SURFACE SCIENCE 704, doi: 10.1016/j.apsusc.2025.163501; FULL TEXT
(HELIOS, TITAN, WITEC-RAMAN, SIMS, KEITHLEY-4200, MPS150)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Witec Alpha 300R (WITEC-RAMAN)
• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)
• Keithley 4200-SCS Parameter Analyzer (KEITHLEY-4200)
• 4-probe station Cascade Microtech MPS 150 (MPS150)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Eliška Šiška Virágová
• Ondřej Šik, Ph.D.
• Dinara Sobola, Ph.D.