Scale correction in submicron computed tomography with a submillimeter field of view

TOMOGRAPHY OF MATERIALS AND STRUCTURES

ZEMEK, M.; BLAŽEK, P.; ŠALPLACHTA, J.; ZIKMUND, T.; PETŘÍK, M.; SCHMITT, R.; KAISER, J., 2025: Scale correction in submicron computed tomography with a submillimeter field of view. TOMOGRAPHY OF MATERIALS AND STRUCTURES 7, p. 46041,500625 - 46042,042291667, doi: 10.1016/j.tmater.2025.100054; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Marek Zemek
• Pavel Blažek
• Jakub Šalplachta
• Tomáš Zikmund, Ph.D.
• Michal Petřík
• Prof. Jozef Kaiser, Ph.D.