Refined Epitaxial Growth of YbRh2Si2 Thin Films

Advanced Materials Interfaces

Isceri, S.; Nguyen, D. H.; Prokofiev, A.; Svagera, R.; Waas, M.; Butera, V.; Fischer, L.; Rasouli, S.; Nazzari, D.; Laudani, F.; Hanke, M.; Giparakis, M.; Bakali, E.; Kolíbalová, E.; Man, O.; Detz, H.; Foelske, A.; Schrenk, W.; Strasser, G.; Paschen, S.; Andrews, A. M., 2025: Refined Epitaxial Growth of YbRh2Si2 Thin Films. ADVANCED MATERIALS INTERFACES 12(21), p. 1 - 11, doi: 10.1002/admi.202500482; FULL TEXT
(VERIOS, HELIOS, TITAN)

Equipment:

• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Eva Kolíbalová, Ph.D.
• Ondřej Man, Ph.D.
• Hermann Detz