Characterization of nanoblisters on HOPG surface

JOURNAL OF ELECTRICAL ENGINEERING

SOBOLA, D.; PAPEŽ, N.; DALLAEV, R.; RAMAZANOV, S.; HEMZAL, D.; HOLCMAN, V., 2019: Characterization of nanoblisters on HOPG surface. JOURNAL OF ELECTRICAL ENGINEERING 70(7), p. 132 - 5, doi: 10.2478/jee-2019-0055; FULL TEXT
(WITEC-RAMAN, KRATOS-XPS, ICON-SPM)

Equipment:

• Witec Alpha 300R (WITEC-RAMAN)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.