Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors

ULTRAMICROSCOPY

STÖGER-POLLACH, M.; BUKVIŠOVÁ, K.; SCHWARZ, S.; KVAPIL, M.; ŠAMOŘIL, T.; HORÁK, M., 2019: Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors. ULTRAMICROSCOPY 200, p. 111 - 14, doi: 10.1016/j.ultramic.2019.03.001; FULL TEXT
(HELIOS, LYRA)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Kristýna Bukvišová
• Michal Kvapil, Ph.D.
• Tomáš Šamořil, Ph.D.
• Michal Horák, Ph.D.