Quality of surface and subsurface layers after WEDM aluminum alloy 7475-T7351 including analysis of TEM lamella

International Journal of Advanced Manufacturing Technology

Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T.; Matousek, R.; Fiala, Z., 2018: Quality of surface and subsurface layers after WEDM aluminum alloy 7475-T7351 including analysis of TEM lamella. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 99(9-12), p. 2309 - 2326, doi: 10.1007/s00170-018-2626-1
(HELIOS, TITAN, TEGRAMIN, NANOINDENTER, LYRA, ICON-SPM)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Hysitron TI 950 (NANOINDENTER)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Radim Zahradníček, Ph.D.