Intersections of two stacking faults in zincblende GaN

ANTOŠ, Z.; VACEK, P.; GRÖGER, R., 2020: . COMPUTATIONAL MATERIALS SCIENCE 180, p. 109620-1 - 7, doi: 10.1016/j.commatsci.2020.109620; FULL TEXT
(TITAN)

Equipment:

• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)

Research Groups:

• CF: CEITEC Nano
• Multiscale Modelling and Measurements of Physical Properties

CEITEC authors:

• Zdeněk Antoš
• Roman Gröger, Ph.D.