Multicut technology used in WEDM machining of Mar-M247

Mouralova, K.; Polzer, A.; Benes, L.; Bednar, J.; Zahradnicek, R.; Kalivoda, M.; Fries, J., 2021: . PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS, PART B: JOURNAL OF ENGINEERING MANUFACTURE , doi: 10.1177/09544054211043484; FULL TEXT
(DEKTAK, TEGRAMIN, HELIOS, TITAN, LYRA)

Equipment:

• Mechanical profilometer Bruker Dektak XT (DEKTAK)
• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Radim Zahradníček, Ph.D.
• Kateřina Mouralová, Ph.D.