Single-layer graphene on epitaxial FeRh thin films

UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F., 2020: . APPLIED SURFACE SCIENCE 514, p. 145923-1 - 7, doi: 10.1016/j.apsusc.2020.145923; FULL TEXT
(MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)

Equipment:

• Magnetron sputtering system BESTEC (MAGNETRON)
• Cryogenic-free VSM and ETO measurement system – Quantum Design, VersaLab (VERSALAB)
• X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)
• UHV Preparation and Analytical System - Low Energy Electron Microscope SPECS FE-LEEM P90 (UHV-LEEM)
• UHV Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100 (UHV-LEIS)
• UHV Preparation and Analytical System - Scanning Probe Microscopy SPECS Aarhus 150 SPM (UHV-SPM)
• Ultra High Vacuum Preparation and Analytical System - Preparation Chamber SPECS (UHV-PREPARATION)
• UHV Preparation and Analytical system - Photoelectron Spectroscopy SPECS Phoibos 150 (UHV-XPS)
• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano
• Molecular Nanostructures at Surfaces
• Nanomagnetism and Spintronics

CEITEC authors:

• Vojtěch Uhlíř, Ph.D.
• Jon Ander Arregi Uribeetxebarria, Ph.D.
• Pavel Procházka, Ph.D.
• Prof. Jan Čechal, Ph.D.
• Stanislav Průša, Ph.D.
• Michal Potoček, Ph.D.
• Prof. Tomáš Šikola