X-ray micro-CT measurement of large parts at very low temperature

REVIEW OF SCIENTIFIC INSTRUMENTS

KOUTECKÝ, T.; ZIKMUND, T.; GLITTOVÁ, D.; PALOUŠEK, D.; ŽIVČÁK, J.; KAISER, J., 2017: X-ray micro-CT measurement of large parts at very low temperature. REVIEW OF SCIENTIFIC INSTRUMENTS 88(3), p. 033707-1 - 6, doi: 10.1063/1.4979077; FULL TEXT
(micro-CT-L240)

Equipment:

• GE phoenix v|tome|x L240 (micro-CT-L240)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Tomáš Zikmund, Ph.D.
• Prof. Jozef Kaiser, Ph.D.