How topographical surface parameters are correlated with CdTe monocrystal surface oxidation

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 9, doi: 10.1016/j.mssp.2018.05.030; FULL TEXT
(VERIOS, TERS, WOOLLAM-VIS)

Equipment:

• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)
• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Ondřej Šik, Ph.D.
• Ondřej Man, Ph.D.
• Dinara Sobola, Ph.D.