Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals

SILICON

DALLAEV, R.; STACH, S.; TALU, S.; SOBOLA, D.; MÉNDEZ-ALBORES, A.; TREJO, G.; GRMELA, L., 2019: Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. SILICON 11(6), p. 1 - 15, doi: 10.1007/s12633-019-0085-4; FULL TEXT
(KRATOS-XPS, ICON-SPM)

Equipment:

• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.