A graphene-based hybrid material with quantum bits prepared by the double Langmuir–Schaefer method
RSC ADVANCES
HRUBÝ, J.; SANTANA, V.; KOSTIUK, D.; BOUČEK, M.; LENZ, S.; KERN, M.; ŠIFFALOVIČ, P.; VAN SLAGEREN, J.; NEUGEBAUER, P., 2019: A graphene-based hybrid material with quantum bits prepared by the double Langmuir–Schaefer method. RSC ADVANCES 9(42), p. 24066 - 8, doi: 10.1039/c9ra04537f; FULL TEXT
(VERIOS, KRATOS-XPS, ICON-SPM)
Vybavení:
- High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
- X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
- Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
Výzkumné skupiny:
- Magneto-Optical and THz Spectroscopy
- CF: CEITEC Nano
- Fabrication and Characterisation of Nanostructures
CEITEC autoři:
+420 54114 9207
nano@ceitec.vutbr.cz
