Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate

MATERIALS

SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
(SIMS, WITEC-RAMAN, LITESCOPE-LYRA, KRATOS-XPS, LYRA)

Equipment:

• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)
• Witec Alpha 300R (WITEC-RAMAN)
• LiteScope 1.0 (LITESCOPE-LYRA)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Martin Konečný
• Michal Potoček, Ph.D.
• Dinara Sobola, Ph.D.