Microstructural characterization of medium entropy alloy thin films

SCRIPTA MATERIALIA

Chawake, N.; Zálešák, J.; Gammer, Ch.; Franz, R.; Cordill, M. J.; Kim, J. T.; Eckert, J., 2020: Microstructural characterization of medium entropy alloy thin films. SCRIPTA MATERIALIA 177, p. 22 - 5, doi: 10.1016/j.scriptamat.2019.10.001; FULL TEXT
(HELIOS)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

Research Groups:

• CF: CEITEC Nano