Shielding effect of oxide isolating layer on surface potential measured by Kelvin probe force microscopy
Master´s Thesis
Švarc, V., 2015: Shielding effect of oxide isolating layer on surface potential measured by Kelvin probe force microscopy. MASTER´S THESIS , p. 1 - 50
(ALD, DIENER, WIRE-BONDER, LYRA)
Equipment:
- Atomic layer deposition system Ultratech/CambridgeNanoTech Fiji 200 (ALD)
- Resist stripper Diener electronic NANO Plasma cleaner (DIENER)
- Wire bonder TPT HB 16 (WIRE-BONDER)
- Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
Research Groups: