Optical characterization of advanced nanomaterials with a high lateral resolution

Master´s Thesis

Liška, P., 2021: Optical characterization of advanced nanomaterials with a high lateral resolution. MASTER´S THESIS , p. 1 - 91; FULL TEXT
(NANOSAM, SNOM-NANONICS, ICON-SPM, LYRA, TITAN, VERIOS, WITEC-RAMAN, KRATOS-XPS, SIMS)

Equipment:

• nanoScanning Auger Microscopy/ Scanning electron microscopy with polarization analysis Scienta Omicron nanoSAM Lab (NANOSAM)
• Scanning Near-field Optical Microscopy Nanonics Imaging MV 4000 (SNOM-NANONICS)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• Witec Alpha 300R (WITEC-RAMAN)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Petr Liška