Multifractal characterization of epitaxial silicon carbide on silicon

MATERIALS SCIENCE-POLAND

Talu, S.; Stach, S.; Ramazanov, S.; Sobola, D.; Ramanazov, G., 2017: Multifractal characterization of epitaxial silicon carbide on silicon. MATERIALS SCIENCE-POLAND 35(3), p. 539 - 547, doi: 10.1515/msp-2017-0049
(TERS)

Equipment:

• Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Research Groups:

• CF: CEITEC Nano