Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO 3 Films on Silicon

ACS Omega

Fawaeer, S. H.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2026: Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO 3 Films on Silicon. ACS OMEGA 11(5), p. 7782 - 7795, doi: 10.1021/acsomega.5c08852; FULL TEXT
(RIGAKU3, VERIOS, KRATOS-XPS, UHV-PLD, MAGNETRON)

Equipment:

• X-ray powder diffractometer Rigaku SmartLab 3kW (RIGAKU3)
• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• UHV Preparation and Analytical System - Pulsed Laser Deposition TSST (UHV-PLD)
• Magnetron sputtering system BESTEC (MAGNETRON)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.