The Influence of WEDM Parameters Setup on the Occurrence of Defects When Machining Hardox 400 Steel

Mouralova, K.; Prokes, T.; Benes, L.; Bednar, J., 2019: . MATERIALS 12(22), p. 3758-1 - 3758-15, doi: 10.3390/ma12223758
(TEGRAMIN, HELIOS, TITAN, LYRA, ICON-SPM)

Equipment:

• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• CF: CEITEC Nano