AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis

MICROSCOPY TODAY

NOVOTNÁ, V., HORÁK, J., KONEČNÝ, M., HEGROVÁ, V., NOVOTNÝ, O., NOVÁČEK, Z., NEUMAN, J., 2020: AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis. MICROSCOPY TODAY , p. 38 - 9, doi: 10.1017/S1551929520000875; FULL TEXT
(MIRA-STAN, LITESCOPE-LYRA)

Equipment:

• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)
• LiteScope 1.0 (LITESCOPE-LYRA)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Martin Konečný
• Zdeněk Nováček, Ph.D.