Exploring nanoscale metallic multilayer Ta/Cu films: Structure and some insights on deformation and strengthening mechanisms

Materials Characterization

Karpinski, D.; Polcar, T.; Bondarev, A., 2024: Exploring nanoscale metallic multilayer Ta/Cu films: Structure and some insights on deformation and strengthening mechanisms. MATERIALS CHARACTERIZATION 212, doi: 10.1016/j.matchar.2024.113933; FULL TEXT
(TITAN, VERIOS, HELIOS)

Equipment:

• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

Research Groups:

• CF: CEITEC Nano