Analysis of the machinability of copper alloy ampcoloy by WEDM

Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: . MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
(TEGRAMIN, HELIOS, TITAN, LYRA, ICON-SPM)

Equipment:

• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Radim Zahradníček, Ph.D.