Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element

Master´s thesis

Pokorný, D., 2019: Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element. MASTER´S THESIS , p. 1 - 71
(WOOLLAM-VIS, ALD-FIJI, KRATOS-XPS)

Vybavení:

• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)
• Atomic layer deposition system Ultratech/CambridgeNanoTech Fiji 200 (ALD-FIJI)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)

Výzkumné skupiny:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures

CEITEC autoři:

• David Pokorný