Defect structures in (001) zincblende GaN/3C-SiC nucleation layers
Journal of Applied Physics
Vacek, P.; Frentrup, M.; Lee, L. Y.; Massabuau, F. C.P.; Kappers, M. J.; Wallis, D. J.; Gröger, R.; Oliver, R. A., 2021: Defect structures in (001) zincblende GaN/3C-SiC nucleation layers. JOURNAL OF APPLIED PHYSICS 129(15), doi: 10.1063/5.0036366; FULL TEXT
(TITAN, ICON-SPM)
Equipment:
- High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
- Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
Research Groups:
CEITEC authors: