The fabrication and characterization of half-Heusler YPdBi thin films
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
POLAT, Ö.; ARREGI URIBEETXEBARRIA, J.; HORÁK, M.; POLČÁK, J.; BUKVIŠOVÁ, K.; ZLÁMAL, J.; ŠIKOLA, T., 2022: The fabrication and characterization of half-Heusler YPdBi thin films. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS 161, p. 1 - 6, doi: 10.1016/j.jpcs.2021.110447; FULL TEXT
(MAGNETRON, RIGAKU9, TITAN, HELIOS, KRATOS-XPS, CRYOGENIC, LYRA)
Equipment:
- Magnetron sputtering system BESTEC (MAGNETRON)
- X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)
- High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
- Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
- X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
- Low Temperature Vibrating Sample Magnetometr Cryogenic Limited (CRYOGENIC)
- Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
Research Groups:
CEITEC authors: