XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

APPLIED SURFACE SCIENCE

Manakhov, A;, Michlicek, M; Felten, A; Pireaux, J J; Necas, D; Zajickova, L., 2017: XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach. APPLIED SURFACE SCIENCE (394), p. 578 - 585, doi: 10.1016/j.apsusc.2016.10.099
(ICON-SPM)

Equipment:

• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

Research Groups:

• CF: CEITEC Nano
• Development of Methods for Analysis and Measuring
• Plasma Technologies

CEITEC authors:

• David Nečas, Ph.D.
• Lenka Zajíčková, Ph.D.