3D localization of spinel (MgAl2O4) and sodium contamination in alumina by TOF-SIMS

MATERIALS CHARACTERIZATION

HOLEŇÁK, R.; SPUSTA, T.; POTOČEK, M.; SALAMON, D.; ŠIKOLA, T.; BÁBOR, P., 2019: 3D localization of spinel (MgAl2O4) and sodium contamination in alumina by TOF-SIMS. MATERIALS CHARACTERIZATION 148, p. 252 - 7, doi: 10.1016/j.matchar.2018.12.019; FULL TEXT
(SIMS, VERIOS)

Equipment:

• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5 (SIMS)
• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures
• Advanced Multifunctional Ceramics

CEITEC authors:

• Tomáš Spusta, Ph.D.
• Michal Potoček, Ph.D.
• David Salamon, Ph.D.
• Prof. Tomáš Šikola
• Petr Bábor, Ph.D.